Understanding Atomic Force Microscopes: Principles, Features, and Applications
An Atomic Force Microscope (AFM) is a powerful imaging tool widely used in nanotechnology, materials science, physics, chemistry, and biological research. It enables researchers to visualize, measure, and manipulate surfaces at the nanoscale, often achieving a resolution of fractions of a nanometer. Unlike traditional optical microscopes limited by the wavelength of light, AFMs rely on mechanical probing, making them essential for studying atomic-level structures.
How an Atomic Force Microscope Works
The AFM operates by scanning a sharp tip mounted on a flexible cantilever across the surface of a sample. As the tip interacts with the surface atoms—through forces like van der Waals forces, electrostatic forces, or mechanical contact—the cantilever deflects. A laser beam reflected from the cantilever into a photodetector records these deflections, which are converted into high-resolution topographical maps.